Search results for " reaction analysis"

showing 10 items of 11 documents

Effects of finite thickness on interfacial widths in confined thin films of coexisting phases

1999

The capillary broadening of a 2-phase interface is investigated both experimentally and theoretically. When a binary mixture in a thin film with thickness D segregates into two coexisting phases the interface between the two phases may form parallel to the substrate due to preferential surface attraction of one of the components. We show that the interfacial profile (of intrinsic width w0) is broadened due to capillary waves, which lead to fluctuations, of correlation length of the local interface positions in the directions parallel to the confining walls. We postulate that acts as an upper cutoff for the spectrum of capillary waves on the interface, so that the effective mean square inter…

Capillary waveMaterials scienceCondensed matter physicsbusiness.industryCapillary actionSubstrate (electronics)Condensed Matter PhysicsElectronic Optical and Magnetic MaterialsCondensed Matter::Soft Condensed MatterPhysics::Fluid DynamicsSurface tensionOpticsNuclear reaction analysisWettingThin filmbusinessFinite thicknessThe European Physical Journal B
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Investigations of TiO2 films deposited by different techniques

1991

High refractive TiO2 films deposited by reactive electron beam evaporation, reactive ion plating and dip coating have been characterized by optical spectroscopy, electron spectroscopy for chemical analysis, Rutherford backscattering spectroscopy, nuclear reaction analysis and Raman spectroscopy. The spectral refractive index n exhibits a strong dependence on the deposition conditions. These findings will be connected to variations in density, stoichiometry, hydrogen content (H2O) and binding structure of the layers. A strong correlation is found between optical quantities and microscopic properties of TiO2 films.

ChemistryIon platingMetals and AlloysAnalytical chemistryPhysics::OpticsSurfaces and InterfacesDip-coatingElectron spectroscopyElectron beam physical vapor depositionSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCondensed Matter::Materials Sciencesymbols.namesakeNuclear reaction analysisMaterials ChemistrysymbolsThin filmSpectroscopyRaman spectroscopyThin Solid Films
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Elastic Recoil Detection Analysis

2008

In 1976, a Canadian group described in detail for the first time a new ion beam analytical method based on the elastic recoil of target nuclei collided with high-energy heavy incident ions. In this case, 25–40-MeV 35Cl impinged on a multilayer C or Cu (backing)/LiF or LiOH/Cu (30–150 nm)/LiF or LiOH and H, Li, O, and F recoiled atoms were detected. These exemplified the main characteristics of elastic recoil detection analysis (ERDA): its sensitivity to depth distribution and its ability to detect light elements in heavy substrates. In 1979, the use of megaelectronvolt energy 4He beams permitted the use of ERDA to be extended to depth profiling of hydrogen isotopes in the near-surface regio…

Elastic recoil detectionNuclear reactionIon beam analysisMaterials scienceIon beamlawNuclear reaction analysisVan de Graaff generatorAtomic physicsRutherford backscattering spectrometryIonlaw.invention
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Effects of heat treatments on the properties of copper phthalocyanine films deposited by glow-discharge-induced sublimation

2006

Copper phthalocyanine films have been deposited by glow-discharge-induced sublimation. The films have undergone postdeposition heat treatments in air at 250 and 290 °C for different times, ranging from 30 min to 14 h. The properties of as-deposited and heated films have been investigated by different techniques in order to determine the effects of heat treatments on the film properties. Fourier transform infrared analysis and UV−visible optical absorption analysis point out a gradual evolution of the film structure from a mixture of α and β polymorphs to the only β polymorph in the sample heated at 290 °C for 14 h. A pronounced decrease of carbon and nitrogen atomic percentages against an o…

Materials Chemistry2506 Metals and Alloysgas sensingGlow dischargeMaterials sciencephthalocyanine EXAFSIon beamAbsorption spectroscopyGeneral Chemical EngineeringAnalytical chemistryAmbientaleGeneral ChemistryRutherford backscattering spectrometryNO2 detectionx-ray absorption spectroscpy; gas sensing; thin films; NO2 detectionX-ray photoelectron spectroscopythin filmsMaterials Chemistry2506 Metals and Alloys; Materials Science (all)Nuclear reaction analysisMaterials Chemistryx-ray absorption spectroscpySublimation (phase transition)Materials Science (all)Thin film
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Influence of laser–target interaction regime on composition and properties of surface layers grown by laser treatment of Ti plates

2009

Surface laser treatment of commercially pure titanium plates was performed in air using two different Nd : YAG sources delivering pulses of 5 and 35 ns. The laser fluence conditions were set to obtain with each source either yellow or blue surface layers. Nuclear reaction analysis (NRA) was used to quantify the amount of light elements in the formed layers. Titanium oxinitrides, containing different amounts of oxygen and nitrogen, were mainly found, except in the case of long pulses and high laser fluence, which led to the growth of titanium dioxide. The structure of the layers was studied by x-ray diffraction and Raman spectroscopy. In addition, reflectance spectra showed the transition fr…

Materials scienceAcoustics and UltrasonicsAnalytical chemistrychemistry.chemical_elementCondensed Matter PhysicsLaserFluenceSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialslaw.inventionsymbols.namesakechemistry.chemical_compoundchemistrylawNuclear reaction analysisVaporizationTitanium dioxidesymbolsSpectroscopyRaman spectroscopyTitaniumJournal of Physics D: Applied Physics
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Wavelength influence on nitrogen insertion into titanium by nanosecond pulsed laser irradiation in air

2013

Abstract We studied in this work the influence of the wavelength (532 vs. 1064 nm) on the insertion of nitrogen in titanium targets by surface laser treatments in air. The laser pulses were of 5 ns and the irradiance was lower than 25 × 10 12  W/m 2 . Results obtained using a frequency-doubled Nd:YAG laser at 532 nm were compared with those previously reported for laser treatments at 1064 nm. Nuclear reaction analysis and micro-Raman spectroscopy were used for determining the composition and the structure of the surface layers, respectively. Results showed the lower efficiency of irradiation at 532 nm for nitrogen insertion, which is possible only above threshold conditions depending on bot…

Materials scienceAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_elementSurfaces and InterfacesGeneral ChemistryCondensed Matter PhysicsLaserNitrogenSurfaces Coatings and Filmslaw.inventionSurface coatingsymbols.namesakechemistrylawNuclear reaction analysissymbolsIrradiationSpectroscopyRaman spectroscopyTitaniumApplied Surface Science
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Mechanism of Heavy Element Retention in Hydrated Layers Formed on Leached Silicate Glasses

1988

ABSTRACTWe have investigated the relationship between hydrated layer formation during aqueous corrosion of silicates and retention of heavy elements (Fe, REE, actinides). Our approach is based on the comparison of the dissolution behaviour of silicate glasses, silicate minerals implanted with increasing doses of lead ions (1×E+12 to 1×E+15 ions/cm2), sorption experiments on silica surfaces and direct precipitation of hydrosilicates. The characterization of reacted surfaces was performed by combining Rutherford backscattering spectrometry (RBS) for profiling heavy elements with Resonant Nuclear Reaction Analysis (RNRA) for hydrogen profilimetry. The accumulation of these elements does not ne…

Materials scienceHydrogenchemistryPrecipitation (chemistry)Nuclear reaction analysisSilicate mineralsInorganic chemistrychemistry.chemical_elementMineralogySorptionActinideRutherford backscattering spectrometryDissolutionMRS Proceedings
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Phase mixture in MOCVD and reactive sputtering TiOxNy thin films revealed and quantified by XPS factorial analysis.

2006

Abstract Titanium oxynitride thin films have been deposited by low-pressure metalorganic chemical vapour deposition and reactive sputtering. The growth temperature for chemical vapour-deposited films and water vapour partial pressure for sputter-deposited films have been used to modulate the chemical composition. Both series have been analysed using X-ray photoelectron spectroscopy (XPS) in order to describe the structure of the materials using a factorial analysis approach. Titanium and metalloid concentrations have also been determined and compared to an elemental analysis performed using Rutherford backscattering spectroscopy and nuclear reaction analysis. The two deposition methods led …

Materials sciencePolymers and PlasticsAnalytical chemistrychemistry.chemical_element02 engineering and technologyChemical vapor deposition01 natural sciences7. Clean energyfactorial analysisX-ray photoelectron spectroscopySputteringNuclear reaction analysis0103 physical sciencesMetalorganic vapour phase epitaxyThin film010302 applied physicsTitanium oxynitrideMetals and AlloysX-ray photoelectron spectroscopy (XPS)[CHIM.MATE]Chemical Sciences/Material chemistry021001 nanoscience & nanotechnologyElectronic Optical and Magnetic MaterialsSurface coatingchemistrythin films[ CHIM.MATE ] Chemical Sciences/Material chemistryCeramics and Composites0210 nano-technologyTitanium
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Synthesis and characterization of cobalt silicide films on silicon

2006

Cobalt silicide has emerged as a leading contact material in silicon technology due to its low resistivity, high stability and small lattice mismatch. In this study, 0.2-0.4 mu m thick Co films were deposited on Si(100) wafers by RF magnetron sputtering at room temperature, and annealed at temperatures from 600 to 900 degrees C in vacuum. As-deposited and annealed samples were characterized by Rutherford backscattering spectrometry (RBS), nuclear reaction analysis (NRA), X-ray diffraction (XRD) and scanning electron microscopy (SEM). Although the Si substrates were sputter cleaned before the deposition, all the samples showed a thin oxide layer at the Si/Co interfaces. Annealing up to 700 d…

Nuclear and High Energy PhysicsMaterials scienceSiliconScanning electron microscopeAnnealing (metallurgy)Analytical chemistrychemistry.chemical_elementSputter depositionRutherford backscattering spectrometrychemistrySputteringElectrical resistivity and conductivityNuclear reaction analysisInstrumentationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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High-resolution characterization of the diffusion of light chemical elements in metallic components by scanning microwave microscopy

2014

International audience; An original sub-surface, high spatial resolution tomographic technique based on scanning microwave microscopy (SMM) is used to visualize in-depth materials with different chemical compositions. A significant phase difference in SMM between aluminum and chromium buried patterns has been observed. Moreover this technique was used to characterize a solid solution of a light chemical element (oxygen) in a metal lattice (zirconium). The large solubility of the oxygen in zirconium leads to modifications of the properties of the solid solution that can be measured by the phase shift signal in the SMM technique. The signal obtained in cross-section of an oxidized Zr sample s…

ZirconiumChemistryAnalytical chemistrychemistry.chemical_element[CHIM.MATE]Chemical Sciences/Material chemistry02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesOxygen[ CHIM.MATE ] Chemical Sciences/Material chemistryNuclear reaction analysis0103 physical sciencesMicroscopyGeneral Materials ScienceLimiting oxygen concentrationSolubility010306 general physics0210 nano-technologyMicrowaveSolid solutionNanoscale
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